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Author SHA1 Message Date
Morten Thunberg Svendsen f5e2bae0aa mtd: tests: fix read, speed and stress tests on NOR flash
Before using block_isbad() check if mtd->block_isbad() is defined.
Calculating pgcnt must be done using pgsize defined to 512 on
NOR and mtd->writesize for NAND, not using  mtd->writesize directly.

Signed-off-by: Morten Thunberg Svendsen <mts.doredevelopment@gmail.com>
Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2010-01-13 09:06:17 +00:00
Artem Bityutskiy 4c2b8a62bb mtd: make pagetest work
The mtd_pagetest test did not initialize the pgsize variable, which
basically means it did not work. This problem was reported by
Török Edwin <edwintorok@gmail.com>

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-11-30 10:02:41 +00:00
Akinobu Mita 7126bd8be4 mtd: add nand_ecc test module
This module tests NAND ECC functions.

The test is simple.

1. Create a 256 or 512 bytes block of data filled with random bytes (data)
2. Duplicate the data block and inject single bit error (error_data)
3. Try to correct error_data
4. Compare data and error_data

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Acked-by: Vimal Singh <vimalsingh@ti.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-11-30 09:41:49 +00:00
Akinobu Mita f54d633637 mtd: cleanup mtd_oobtest
- Remove unnecessary memset for bbt
  All entries will be initialized at a few lines below
- Remove unnecessary initialization for mtd->erasesize
- Use write_whole_device()

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-10-17 15:39:48 +01:00
Roel Kluin c6f7e7beb9 mtd: tests: fix read buffer overflows
Check whether index is within bounds before testing the element.

Signed-off-by: Roel Kluin <roel.kluin@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-09-04 09:40:17 +01:00
Hannes Eder 23d4249491 trivial: NULL noise: drivers/mtd/tests/mtd_*test.c
Fix this sparse warnings:
  drivers/mtd/tests/mtd_oobtest.c:139:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:192:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:219:41: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:284:25: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:525:25: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:545:25: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:569:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:589:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:613:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:633:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:673:41: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:701:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_readtest.c:74:41: warning: Using plain integer as NULL pointer

Signed-off-by: Hannes Eder <hannes@hanneseder.net>
Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: Jiri Kosina <jkosina@suse.cz>
2009-03-30 15:22:04 +02:00
David Woodhouse 647b0d3854 [MTD] [TESTS] Fix some size_t printk format warnings
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2009-01-05 16:31:03 +00:00
Artem Bityutskiy 9faa8153be MTD: add MTD tests to compilation
Add MTD tests to Kconfig and Makefiles.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-10 17:00:44 +02:00
Artem Bityutskiy 4db451a764 MTD: tests: add mtd_torturetest
This test is designed to work for very long time and it tries to
wear few eraseblocks.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-10 17:00:40 +02:00
Artem Bityutskiy bf60862a58 MTD: tests: add mtd_subpagetest
This tests makes sure sub-pages on NAND MTD device work fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy 7163cea15f MTD: tests: add mtd_stresstest
This test just performs random operations on random eraseblocks.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy 72069be936 MTD: tests: add mtd_speedtest
This test examines I/O speed of the flash device.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy 72091b6889 MTD: tests: add mtd_readtest
A simple tests which reads whole MTD device one page at a time.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy e73f217439 MTD: tests: add mtd_pagetest
This test checks that NAND pages read/write work fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:14 +02:00
Artem Bityutskiy e3644da756 MTD: tests: add mtd_oobtest
This test checks that OOB of a NAND MTD device works fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
2008-12-08 13:56:13 +02:00